Request a Quote on Part Number TS268EU with the NSN 6625-00-923-6534 by Voron Electronics Corp

Part Number: TS268EU

Manufacturer: Voron Electronics Corp

NSN: 6625-00-923-6534

NIIN: 009236534

Item Name : Test Set Semiconduc

CAGE Code: 94518

FSC: 6625 Electrical and Electronic Properties Measuring and Testing Instruments

FSG: 66 Instruments and Laboratory Equipment

Country : USA

NCB Code : 00

Thank you for your interest in Voron Electronics Corp part number TS268EU, a Test Set Semiconduc item that we offer here on Aerospace Materials Supply. This product is listed with the NSN 6625-00-923-6534, and you can obtain customized procurement solutions on this component from our team members by completing and submitting the form below. For our specialists to best deliver quotes that accommodate your specifications, please be sure we are presented with essential details like your target price, desired quantity, and anticipated fulfillment timeline. Once we have the opportunity to receive and review your submission, we will strive to provide a tailored response for your consideration within 15 minutes or less.

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Besides part number TS268EU, you may browse our platform further for similar components produced by Voron Electronics Corp under the CAGECode 94518, as well as additional products that are categorized under FSC 6625 Electrical and Electronic Properties Measuring and Testing Instruments. If you have any questions regarding our services or the NSN 6625-00-923-6534 items that we sell, you may always give us a call or email, as we would be delighted to assist you in any way that we can. Otherwise, we encourage you to request a quote for part number TS268EU at your earliest convenience.

Characteristics Data of NSN 6625-00-923-6534, 6625009236534

MRC	Criteria	Characteristic
ABRY	Length	8.187 INCHES NOMINAL
MRC	Decoded Requirement	Clear Text Reply
HGTH	Height	3.625 INCHES NOMINAL
AQXZ	Operating Test Capability	FRONT RESISTANCE-NOT GREATER THAN 0.5 KILOHM FOR A GOOD CRYSTAL; BACK RESISTANCE-RATIO OF BACK TO FRONT RESISTANCE GREATER THAN 10 TO 1 FOR A GOOD CRYSTAL; BACK CURRENT-CRYSTAL SHOULD NOT INDICATE CURRENT GREATER THAN - CRYSTAL IN21 AND IN23,IN23A,IN25,IN21A AND IN23B,IN21B,IN26 WE,IN26 SYL,IN78 SYL - CURRENT D. C. 0.400 MA,0.300 MA,0.250 MA,0.175 MA,0.125 MA,0.110 MA,0.230 MA,0.160 MA
ABGL	Width	6.000 INCHES NOMINAL
AQXY	Test Type For Which Designed	FRONT RESISTANCE OF CRYSTAL; BACK RESISTANCE OF CRYSTAL; BACK CURRENT OF CRYSTAL
ALSF	Internal Battery Accommodation	INCLUDED
ANPZ	Inclosure Feature	SINGLE ITEM W/CARRYING CASE